Semiconductor package with lead tip inspection feature
US11587800B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 22, 2020 |
| Grant date | Feb 21, 2023 |
| Priority date | — |
| Expiry date | Jun 5, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2224/96
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A method includes providing a carrier, mounting a plurality of semiconductor dies on the carrier, forming a region of electrically insulating encapsulant material on the carrier that covers each of the semiconductor dies, removing sections of the encapsulant material to form gaps in the region of electrically insulating encapsulant material between each of the semiconductor dies, forming electrically conductive material within the gaps, and singulating the region of electrically insulating encapsulant material along each of the gaps to form a plurality of discrete encapsulant bodies. Each of the packaged semiconductor devices comprises a sidewall-facing terminal that is disposed on a sidewall of the encapsulant body. For each of the packaged semiconductor devices the sidewall-facing terminal is electrically connected to the semiconductor die of the respective packaged semiconductor device. The sidewall-facing terminal of each packaged semiconductor device is provided from the electrically conductive material formed within the gaps.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.