System and method for generation of quality metrics for optimization tasks in topology synthesis of a network
US11601357B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 22, 2020 |
| Grant date | Mar 7, 2023 |
| Priority date | — |
| Expiry date | Feb 13, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2115/10
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
System and methods are disclosed to qualify networks properties and that can be used for topology synthesis of networks, such as a network-on-chip (NoC). In accordance with various embodiments and different aspects of the invention, quality metric are generated, analyzed, and used to determine a quantitative quality set of values for a given generated solution for a network. The method disclosed allows the network designer or an automated network generation process to understand if the results produced are a good, an average or a bad solution. The advantage of the invention includes simplification of design process and the work of the designer by using quality metrics. Various quality metrics are generated using network definitions. These quality metrics provide quality evaluation and the quality assessment of the optimization process for a generated (optimized) network. The quality metrics include analyzing latency through a network and analyzing total wore length used by the network.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.