Patent · US Active

Control data registers for scan testing

US11680984B1 · kind B1 · utility

0Cited by

2References

20Claims

0Family size

Assignee

TEXAS INSTRUMENTS INCORPORATED · US

Inventors

Wilson Pradeep · Savanuru, IN
Aravinda Acharya · Bengaluru, IN
Nikita Naresh · Kanchinakote, IN

Key dates

Filing date	Feb 28, 2022
Grant date	Jun 20, 2023
Priority date	—
Expiry date	Feb 28, 2042

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/31926
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

In some examples, a circuit includes a custom control data register (CCDR) circuit having a scan path. The CCDR circuit includes a shift register and an update register. The shift register is configured to receive scan data from a scan data input (CDR_SCAN_IN) on a first clock edge responsive to a scan enable signal (CDR_SCAN_EN) being enabled. The update register is configured to receive data from the shift register on a second clock edge after the first clock edge when the scan enable (CDR_SCAN_EN) is enabled. The update register data is asserted as a scan data output (CDR_SCAN_OUT). The second scan path includes the scan data input, the shift register, the update register, and the scan data output.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.