Automatic window generation for process trace
US11687439B2 · kind B2 · utility
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17Claims
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Key dates
| Filing date | Jul 22, 2021 |
| Grant date | Jun 27, 2023 |
| Priority date | — |
| Expiry date | Oct 2, 2041 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/45031
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Automatic definition of windows for trace analysis. For each process step, the trace data are aligned to both the start of the process step and the end of the process step, and statistics including rate of change are calculated from both the start of the process step and the end of the process step. Windows are generated based on analysis of the calculated statistics.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.