Inventor · Narita, JP

Michio Aruga

15Patents
12h-index
23Co-inventors
78Inventor score

Filing activity: May 18, 1993 → Jul 22, 2021

Most-cited inventions

PatentTitleAreaCited byStatus
US6660662B2 Method of reducing plasma charge damage for plasma processes Chemistry; Metallurgy 456 Expired
US7036453B2 Apparatus for reducing plasma charge damage for plasma processes Chemistry; Metallurgy 449 Expired
US5456757A Susceptor for vapor deposition Chemistry; Metallurgy 356 Expired
US5688331A Resistance heated stem mounted aluminum susceptor assembly Chemistry; Metallurgy 317 Expired
US5500249A Uniform tungsten silicide films produced by chemical vapor deposition Emerging Cross-Sectional Technologies 252 Expired
US5643633A Uniform tungsten silicide films produced by chemical vapor depostiton Emerging Cross-Sectional Technologies 46 Expired
US5877086A Metal planarization using a CVD wetting film Electricity 34 Expired
US5482749A Pretreatment process for treating aluminum-bearing surfaces of deposition chamber prior to deposition of tungsten silicide coating on substrate therein Chemistry; Metallurgy 20 Expired
US5558910A Uniform tungsten silicide films produced by chemical vapor deposition Emerging Cross-Sectional Technologies 18 Expired
US5510297A Process for uniform deposition of tungsten silicide on semiconductor wafers by treatment of susceptor having aluminum nitride surface thereon with tungsten silicide after cleaning of susceptor Emerging Cross-Sectional Technologies 16 Expired
US6090706A Preconditioning process for treating deposition chamber prior to deposition of tungsten silicide coating on active substrates therein Emerging Cross-Sectional Technologies 13 Expired
US5997950A Substrate having uniform tungsten silicide film and method of manufacture Chemistry; Metallurgy 13 Expired
US5779848A Corrosion-resistant aluminum nitride coating for a semiconductor chamber window Emerging Cross-Sectional Technologies 6 Expired
US6632726B2 Film formation method and film formation apparatus Electricity 2 Expired
US11687439B2 Automatic window generation for process trace Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.