PDF SOLUTIONS, INC.
🏢 View company profile →202Patents
170Active
202Granted
56Portfolio score
Filing activity: Nov 18, 1999 → Jun 12, 2024 · 24 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6795952B1 | System and method for product yield prediction using device and process neighborhood characterization vehicle | Electricity | 235 | Expired |
| US6834375B1 | System and method for product yield prediction using a logic characterization vehicle | Electricity | 222 | Expired |
| US6826738B2 | Optimization of die placement on wafers | Electricity | 206 | Expired |
| US7278118B2 | Method and process for design of integrated circuits using regular geometry patterns to obtain geometrically consistent component features | Physics | 204 | Expired |
| US7487474B2 | Designing an integrated circuit to improve yield using a variant design element | Physics | 175 | Expired |
| US6449749B1 | System and method for product yield prediction | Electricity | 156 | Expired |
| US6901564B2 | System and method for product yield prediction | Electricity | 127 | Expired |
| US7592827B1 | Apparatus and method for electrical detection and localization of shorts in metal interconnect lines | Physics | 99 | Active |
| US8575955B1 | Apparatus and method for electrical detection and localization of shorts in metal interconnect lines | Physics | 85 | Active |
| US7739065B1 | Inspection plan optimization based on layout attributes and process variance | Physics | 84 | Active |
| US8178876B2 | Method and configuration for connecting test structures or line arrays for monitoring integrated circuit manufacturing | Electricity | 81 | Active |
| US9496119B1 | E-beam inspection apparatus and method of using the same on various integrated circuit chips | Electricity | 77 | Active |
| US6978229B1 | Efficient method for modeling and simulation of the impact of local and global variation on integrated circuits | Electricity | 26 | Expired |
| US7174521B2 | System and method for product yield prediction | Electricity | 20 | Expired |
| US6475871B1 | Passive multiplexor test structure for integrated circuit manufacturing | Electricity | 18 | Expired |
| US9799575B2 | Integrated circuit containing DOEs of NCEM-enabled fill cells | Electricity | 17 | Active |
| US7003742B2 | Methodology for the optimization of testing and diagnosis of analog and mixed signal ICs and embedded cores | Physics | 14 | Expired |
| US9805994B1 | Mesh-style NCEM pads, and process for making semiconductor dies, chips, and wafers using in-line measurements from such pads | Electricity | 13 | Active |
| US9870962B1 | Integrated circuit including NCEM-enabled, interlayer overlap-configured fill cells, with NCEM pads formed from at least three conductive stripes positioned between adjacent gates | Electricity | 12 | Active |
| US7902852B1 | High density test structure array to support addressable high accuracy 4-terminal measurements | Physics | 12 | Active |
| US9595536B1 | Standard cell library that includes 13-CPP and 17-CPP D flip-flop cells, with DFM-optimized M0 cuts and V0 adjacencies | Electricity | 12 | Active |
| US7434197B1 | Method for improving mask layout and fabrication | Physics | 12 | Expired |
| US9627370B1 | Integrated circuit containing standard logic cells and library-compatible, NCEM-enabled fill cells, including at least via-open-configured, GATE-short-configured, GATECNT-short-configured, and TS-short-configured, NCEM-enabled fill cells | Electricity | 11 | Active |
| US6787800B2 | Test vehicle with zig-zag structures | Physics | 11 | Expired |
| US7047505B2 | Method for optimizing the characteristics of integrated circuits components from circuit specifications | Physics | 10 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.