Diagnosing multicycle faults and/or defects with single cycle ATPG test patterns
US11740284B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 2, 2021 |
| Grant date | Aug 29, 2023 |
| Priority date | — |
| Expiry date | Feb 15, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/31
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit (IC) test engine generates single cycle test patterns for testing for candidate faults and/or defects of a first set of static faults and/or defects of an IC design. A diagnostics engine receives single cycle test result data characterizing application of the single cycle test patterns to a fabricated IC chip based on the IC design and fault-simulates a subset of the single cycle test patterns against a fault model that includes multicycle faults and/or defects utilizing sim-shifting to diagnose a second set of static faults and/or defects in the fabricated IC chip that are only detectable with multicycle test patterns. The diagnostics engine further scores candidate faults and/or defects in the first set of static faults and/or defects and the second set of static faults and/or defects for applicable test patterns to determine a most likely fault and/or defect present in the fabricated IC chip.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.