Patent · US Active

Re-programmable self-test

US11768240B2 · kind B2 · utility

0Cited by

6References

11Claims

0Family size

Assignee

TEXAS INSTRUMENTS INCORPORATED · US

Inventors

Neil John Simpson · Rockwall, US
Alan Hales · Richardson, US

Key dates

Filing date	Jul 9, 2021
Grant date	Sep 26, 2023
Priority date	—
Expiry date	Jul 9, 2041

Classification

Technology area (CPC G)Physics
CPC primaryG11C2029/3602
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A built-in self-test (BIST) method includes providing expanded test patterns to a logic circuit under test, generating a first signature based on a response of the logic circuit to the expanded test patterns, generating a second signature based on the first signature, wherein the second signature is a compressed version of the first signature, selecting one of the first signature or the second signature in response to a control signal, comparing the selected one of the first signature or the second signature to an expected signature, and, based on the comparison of the selected one of the first signature or the second signature to the expected signature, determining that the logic circuit passes or fails BIST.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.