Patent · US Active

Methods for reflector film growth

US11776980B2 · kind B2 · utility

0Cited by
4References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 13, 2020
Grant dateOct 3, 2023
Priority date
Expiry dateJan 22, 2042

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67167
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

Methods and apparatus for forming reflector films are described A liner is formed on a substrate surface followed by formation of the reflector layer so that there is no oxygen exposure between liner and reflector layer formation. In some embodiments, a high aspect ratio structure is filled with a reflector material by partially filling the structure with the reflector material while growth is inhibited at a top portion of the structure, reactivating the top portion of the substrate and then filling the structure with the reflector material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.