Yixiong Yang
53Patents
3h-index
109Co-inventors
65Inventor score
Filing activity: Oct 6, 2014 → Feb 20, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10407771B2 | Atomic layer deposition chamber with thermal lid | Electricity | 7 | Active |
| US9748354B2 | Multi-threshold voltage structures with a lanthanum nitride film and methods of formation thereof | Electricity | 4 | Active |
| US10199230B2 | Methods for selective deposition of metal silicides via atomic layer deposition cycles | Electricity | 3 | Active |
| US11715667B2 | Thermal process chamber lid with backside pumping | Electricity | 2 | Active |
| US11289579B2 | P-type dipole for p-FET | Electricity | 2 | Active |
| US9595466B2 | Methods for etching via atomic layer deposition (ALD) cycles | Electricity | 2 | Active |
| US11384432B2 | Atomic layer deposition chamber with funnel-shaped gas dispersion channel and gas distribution plate | Electricity | 2 | Active |
| US11437271B2 | Seamless gap fill | Electricity | 1 | Active |
| US11245022B2 | Integrated dipole flow for transistor | Electricity | 1 | Active |
| US11658218B2 | P-type dipole for p-FET | Electricity | 1 | Active |
| US11335591B2 | Thermal process chamber lid with backside pumping | Electricity | 1 | Active |
| US11062900B2 | Method of reducing effective oxide thickness in a semiconductor structure | Electricity | 1 | Active |
| US11018009B2 | Tuning work function of p-metal work function films through vapor deposition | Electricity | 0 | Active |
| US10755947B2 | Methods of increasing selectivity for selective etch processes | Electricity | 0 | Active |
| US11894233B2 | Electronic device having an oxygen free platinum group metal film | Electricity | 0 | Active |
| US12288717B2 | Metal based hydrogen barrier | Electricity | 0 | Active |
| US11997849B2 | V-NAND stacks with dipole regions | Electricity | 0 | Active |
| US11908914B2 | Methods of forming semiconductor structures | Electricity | 0 | Active |
| US11552177B2 | PMOS high-K metal gates | Electricity | 0 | Active |
| US12051734B2 | PMOS high-k metal gates | Electricity | 0 | Active |
| US12114488B2 | Enhancing gapfill performance of dram word line | Electricity | 0 | Active |
| US11996455B2 | P-type dipole for P-FET | Electricity | 0 | Active |
| US10991586B2 | In-situ tungsten deposition without barrier layer | Electricity | 0 | Active |
| US10636705B1 | High pressure annealing of metal gate structures | Electricity | 0 | Active |
| US11932939B2 | Lids and lid assembly kits for atomic layer deposition chambers | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.