Self-repair verification
US11791011B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 3, 2022 |
| Grant date | Oct 17, 2023 |
| Priority date | — |
| Expiry date | May 3, 2042 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/76
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods, systems, and devices for self-repair verification are described. A memory system may receive, at a memory device, a command to initiate a repair operation. The memory system may perform the repair operation by replacing a first row of memory cells of the memory device with a second row of memory cells of the memory device. The memory system may write first data to the second row of memory cells, and read second data from the second row of memory cells, based on a stored indication associated with the replacement of rows. The memory device may output an error flag with a first value based at least in part on reading the second data, and the first value of the error flag may indicate that the repair operation was successfully performed based at least in part on the second data matching the first data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.