Takuya Tamano
4Patents
0h-index
5Co-inventors
21Inventor score
Filing activity: May 3, 2022 → Apr 20, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US12100467B2 | Systems and methods for testing redundant fuse latches in a memory device | Physics | 0 | Active |
| US12100476B2 | Test mode security circuit | Physics | 0 | Active |
| US12394501B2 | Apparatus with adjustable diagnostic mechanism and methods for operating the same | Physics | 0 | Active |
| US11791011B1 | Self-repair verification | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.