Creating interconnects between dies using a cross-over die and through-die vias
US11830817B2 · kind B2 · utility
1Cited by
1References
20Claims
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Key dates
| Filing date | Oct 30, 2020 |
| Grant date | Nov 28, 2023 |
| Priority date | — |
| Expiry date | Oct 30, 2040 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2225/06562
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A semiconductor package includes a first die, a second die, and an interconnect die coupled to a first plurality of through-die vias in the first die and a second plurality of through-die vias in the second die. The interconnect die provides communications pathways the first die and the second die.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.