Scan chain self-testing of lockstep cores on reset
US11852683B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 17, 2023 |
| Grant date | Dec 26, 2023 |
| Priority date | — |
| Expiry date | Jan 17, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318566
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system is provided that includes a memory configured to store test patterns. A first lockstep core and a second lockstep core are configured to receive the same set of test patterns. First scan outputs are generated from the first lockstep core, and second scan outputs are generated from the second lockstep core during a reset of the first lockstep core and the second lockstep core. A comparator can be coupled to the first lockstep core and the second lockstep core and is configured to compare the first scan outputs to the second scan outputs. The first and second lockstep cores can be initialized to a similar state if the first and second scan outputs are the same. The first and second lockstep cores can comprise non-resettable flip flops.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.