Patent · US Active

Wafer chip scale packages with visible solder fillets

US11855024B2 · kind B2 · utility

0Cited by
0References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 31, 2021
Grant dateDec 26, 2023
Priority date
Expiry dateDec 10, 2041

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2224/81801
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

In some examples a wafer chip scale package (WCSP) includes a semiconductor die having a device side in which a circuit is formed, and a redistribution layer (RDL) coupled to the device side that is positioned within an insulating member. In addition, the WCSP includes a scribe seal circumscribing the circuit along the device side, wherein the RDL abuts the scribe seal. Further, the WCSP includes a conductive member coupled to the RDL. The conductive member is configured to receive a solder member, and the insulating member does not extend along the device side of the semiconductor die between the conductive member and a portion of an outer perimeter of the WCSP closest to the conductive member.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.