Patent · US Active

Optical technique for material characterization

US11927481B2 · kind B2 · utility

0Cited by

2References

22Claims

0Family size

Assignee

NOVA LTD. · IL

Inventors

Gilad Barak · Rehovot, IL
Yonatan Oren · Kiryat Ono, IL

Key dates

Filing date	Dec 28, 2022
Grant date	Mar 12, 2024
Priority date	—
Expiry date	Dec 28, 2042

Classification

Technology area (CPC G)Physics
CPC primaryG01J2003/283
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A polarized Raman Spectrometric system for defining parameters of a polycrystalline material, said system comprising: a polarized Raman Spectrometric apparatus, a computer-controlled sample stage for positioning a sample at different locations, and a computer comprising a processor and an associated memory.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.