Systems and methods for multidimensional dynamic part average testing

US12007428B2 · kind B2 · utility

Assignee

• ADVANTEST CORPORATION · JP

Inventors

• Kenneth M. Butler · Richardson, US
• Ira Leventhal · San Jose, US
• Constantinos Xanthopoulos · San Jose, US
• Alan D. Hart · Redwood City, US
• Brian Buras · Austin, US
• Keith Schaub · Austin, US

Key dates

• Filing date: Oct 8, 2021
• Grant date: Jun 11, 2024
• Expiry date: Oct 8, 2041

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/31718
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Embodiments of the present invention provide systems and methods for multidimensional parts average testing for testing devices and analyzing testing results to detect outliers according to embodiments of the present invention. The testing can include calculating multivariate (e.g., bivariate) statistics using delta measurements of like devices, a ratio of measurements, or principal component analysis that identifies eigenvectors and eigenvalues to define meta parameters, for example. Raw test result data can be converted to residual space and robust regression can be performed to prevent outlier results from influencing regression, thereby reducing overkill advantageously.