System and method for performing tear film structure measurement
US12023099B2 · kind B2 · utility
0Cited by
8References
26Claims
0Family size
Assignee
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Key dates
| Filing date | Sep 13, 2021 |
| Grant date | Jul 2, 2024 |
| Priority date | — |
| Expiry date | Feb 13, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/2813
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus and methods are described for performing tear film structure measurement on a tear film of an eye of a subject. A broadband light source (100) is configured to generate broadband light. A spectrometer (250) is configured to measure a spectrum of light of the broadband light that is reflected from at least one spot on the tear film, the spot having a diameter of between 100 microns and 240 microns. A computer processor (28) is coupled to the spectrometer and configured to determine a characteristic of the tear film based upon the spectrum of light measured by the spectrometer. Other applications are also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.