Patent · US Active

Method and light microscope for a high-resolution examination of a sample

US12055728B2 · kind B2 · utility

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33Claims

0Family size

Assignee

ABBERIOR INSTRUMENTS GMBH · DE

Inventors

Roman SCHMIDT · Oettingen, DE
Benjamin Harke · Oettingen, DE
Matthias Reuss · Sundbyberg, SE
Lars Kastrup · Göttingen, DE

Key dates

Filing date	Mar 25, 2022
Grant date	Aug 6, 2024
Priority date	—
Expiry date	Mar 25, 2042

Classification

Technology area (CPC G)Physics
CPC primaryG02B21/008
WIPO fieldOptics
WIPO sectorInstruments

Abstract

The present specification relates to a method for light microscopic examination of a sample (6), in particular by means of laser scanning or MINFLUX microscopy, in which a drift of the sample (6) or of an object in a sample (6) with respect to the light microscope (26) is detected and, if necessary, corrected. In particular, the present specification relates to a corresponding method for examining the sample (6) using laser scanning or MINFLUX microscopy. For this purpose, reference markers (8, 13) are located in the sample, the position of which is repeatedly determined according to the MINFLUX principle in order to determine the drift.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.