Patent · US Active

Plasma processing system and method using radio frequency and microwave power

US12131887B2 · kind B2 · utility

0Cited by
0References
22Claims
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Assignee

Inventors

Key dates

Filing dateMay 4, 2021
Grant dateOct 29, 2024
Priority date
Expiry dateJul 31, 2042

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67069
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A plasma processing system includes a vacuum system, a plasma processing chamber including a chamber cavity coupled to the vacuum system, a substrate holder including a surface inside the chamber cavity, a radio frequency (RF) source electrode coupled to an RF power source, the RF source electrode configured to ignite plasma in the chamber cavity. The system includes microwave source coupled to a microwave oscillator, and an electromagnetic (EM) metasurface, where the EM metasurface having a major surface electromagnetically coupled to the microwave source, the major surface configured to couple microwave power to the plasma in the chamber cavity.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.