Patent · US Active

Etch uniformity improvement for single turn internal coil PVD chamber

US12136544B2 · kind B2 · utility

0Cited by
9References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 14, 2022
Grant dateNov 5, 2024
Priority date
Expiry dateJul 14, 2042

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/3323
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

Methods and apparatus for generating a magnetic field external to a physical vapor deposition (PVD) chamber to improve etch or deposition uniformity on a substrate disposed inside of the PVD chamber are provided herein. In some embodiments, a process chamber, includes a chamber body defining an interior volume therein; a pedestal disposed in the interior volume for supporting a substrate; a coil disposed in the interior volume above the pedestal; and an external magnet assembly, comprising: a housing coupled to the chamber body; and a plurality of magnets disposed external to the chamber body coupled to the housing and arranged asymmetrically about the chamber body.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.