Patent · US Active

Early detection of programming failure for non-volatile memory

US12148489B2 · kind B2 · utility

0Cited by
3References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 26, 2022
Grant dateNov 19, 2024
Priority date
Expiry dateApr 25, 2043

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2029/1202
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An apparatus is provided that includes a block including a word line coupled to a plurality of memory cells, and a control circuit coupled to the word line. The control circuit is configured to program the plurality of memory cells by applying program pulses to the word line in a plurality of program loops, determining a first count of a number of the program loops used to complete programming a first subset of the plurality of memory cells to a first programmed state, first comparing the first count to a corresponding first lower limit and a corresponding first upper limit, and determining whether programming the plurality of memory cells has failed based on a result of the first comparing step.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.