Systems and methods for testing virtual functions of a device under test
US12222844B2 · kind B2 · utility
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21Claims
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Key dates
| Filing date | Feb 24, 2023 |
| Grant date | Feb 11, 2025 |
| Priority date | — |
| Expiry date | May 3, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/0679
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Embodiments of the present invention can provide an extended NVMe driver that supports exercising virtual functions (and related physical functions) of a DUT without using a VM or hypervisor. In this way, the amount of memory and processing resources used for testing NVMe SSDs can be significantly reduced, and a large number of DUTs (e.g., up to 16 DUTs) can be tested in parallel independently. In other words, each DUT is tested in isolation, as if is the only device being tested, and there are no race conditions or competition for resources between workloads during testing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.