Srdjan Malisic
16Patents
1h-index
9Co-inventors
39Inventor score
Filing activity: Dec 20, 2018 → Aug 15, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10976361B2 | Automated test equipment (ATE) support framework for solid state device (SSD) odd sector sizes and protection modes | Physics | 5 | Active |
| US11430536B2 | Software-focused solution for arbitrary all-data odd sector size support | Physics | 1 | Active |
| US12055581B2 | Software directed firmware acceleration | Physics | 1 | Active |
| US12353306B2 | Management of hot add in a testing environment for DUTs that are CXL protocol enabled | Physics | 0 | Active |
| US12216559B2 | Systems and methods for parallel testing of multiple namespaces located in a plurality of devices under test | Physics | 0 | Active |
| US11237202B2 | Non-standard sector size system support for SSD testing | Physics | 0 | Active |
| US12203978B2 | Flexible sideband support systems and methods | Physics | 0 | Active |
| US12293802B2 | Memory queue operations to increase throughput in an ATE system | Physics | 0 | Active |
| US11899550B2 | Enhanced auxiliary memory mapped interface test systems and methods | Physics | 0 | Active |
| US12360868B2 | CXL protocol enablement for test environment systems and methods | Physics | 0 | Active |
| US12222844B2 | Systems and methods for testing virtual functions of a device under test | Physics | 0 | Active |
| US11733290B2 | Flexible sideband support systems and methods | Physics | 0 | Active |
| US12332829B2 | Automatic test equipment architecture providing odd sector size support | Physics | 0 | Active |
| US12248390B2 | Lockless log and error reporting for automatic test equipment | Physics | 0 | Active |
| US11650893B2 | Multiple name space test systems and methods | Physics | 0 | Active |
| US12197303B2 | Systems and methods for testing cxl enabled devices in parallel | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.