Substrate type sensor and method of measuring the impact point and the impact force of chemical
US12224189B2 · kind B2 · utility
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9Claims
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Key dates
| Filing date | Dec 29, 2021 |
| Grant date | Feb 11, 2025 |
| Priority date | — |
| Expiry date | Jan 7, 2043 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/67259
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A substrate type sensor includes a substrate shape member, a pressure sensor panel provided at the substrate shape member, the pressure sensor panel including a plurality of pressure sensors, a central module including a transmission unit, the reception unit receiving data from the pressure sensor panel, and a battery proving power to the pressure sensor panel and the central module.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.