Lockless log and error reporting for automatic test equipment
US12248390B2 · kind B2 · utility
0Cited by
3References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 30, 2023 |
| Grant date | Mar 11, 2025 |
| Priority date | — |
| Expiry date | Mar 30, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/0787
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Device testing techniques including allocating a log memory, testing a device, and storing test result during testing of the device in the allocated log memory. The allocated log memory can be accessed through an application programming interface (API) during testing of the device, wherein the allocated log memory remains unlocked during testing of the device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.