Optoelectronic semiconductor structure comprising a p-type injection layer based on InGaN
US12328975B2 · kind B2 · utility
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Key dates
| Filing date | Feb 25, 2020 |
| Grant date | Jun 10, 2025 |
| Priority date | — |
| Expiry date | Dec 20, 2041 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10H20/815
Abstract
An optoelectronic semiconductor structure comprises an InGaN-based active layer disposed between an n-type injection layer and a p-type injection layer, the p-type injection layer comprising a first InGaN layer having a thickness between 50 and 350 nm and, disposed on the first layer, a second layer having a GaN surface portion.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.