Automatic test equipment architecture providing odd sector size support
US12332829B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 30, 2023 |
| Grant date | Jun 17, 2025 |
| Priority date | — |
| Expiry date | Apr 26, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2213/3852
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Automatic test equipment (ATE) configured to test devices under test (DUTs) can include a host device tester, one or more load boards, and one or more host bus adapters (HBAs). The host device tester does not support odd sector sizes and/or non-standard sector sizes. The one or more load boards can be communicatively coupled to the host device. The one or more HBAs can be communicatively coupled between respective load boards and one or more respective devices under test (DUTs). The one or more load boards can be configured to communicate with respective HBAs using one or more first communication protocol interfaces. The one or more HBAs can be configured to communicate with the respective DUTs using one or more second communication protocol interfaces. The HBAs can be configured to translate commands and data between the host device tester and the one or more DUTs that support odd sector size or non-standard sector size.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.