Machine-learning-based design-for-test (DFT) recommendation system for improving automatic test pattern generation (ATPG) quality of results (QoR)

US12333227B1 · kind B1 · utility

Assignee

• SYNOPSYS, INC. · US

Inventors

• Apik A. Zorian · Santa Clara, US
• Fadi Maamari · Mountain View, US
• Suryanarayana Duggirala · San Jose, US
• Mahilchi Milir Vaseekar Kumar · San Jose, US
• Basim Mohammed Issa Shanyour · Carbondale, US

Key dates

• Filing date: Oct 18, 2023
• Grant date: Jun 17, 2025
• Expiry date: Oct 18, 2043

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/318536
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A first set of features may be extracted from a first integrated circuit (IC) design. A trained machine learning (ML) model may predict a set of ranked test-case configurations for the first IC design based on the first set of features. A test-case configuration may correspond to a count of scan chain input and output ports and a scan chain length value.