Fadi Maamari
14Patents
5h-index
18Co-inventors
63Inventor score
Filing activity: Dec 2, 1992 → Dec 6, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6510534B1 | Method and apparatus for testing high performance circuits | Physics | 45 | Expired |
| US6457161B1 | Method and program product for modeling circuits with latch based design | Physics | 11 | Expired |
| US8533647B1 | Method for generating an integrated and unified view of IP-cores for hierarchical analysis of a system on chip (SoC) design | Physics | 7 | Active |
| US5418792A | Method for the speedup of test vector generation for digital circuits | Physics | 6 | Expired |
| US7191374B2 | Method of and program product for performing gate-level diagnosis of failing vectors | Physics | 6 | Expired |
| US11288428B1 | Integrated circuit design modification for localization of scan chain defects | Physics | 3 | Active |
| US5420871A | Method for maintaining bus integrity during testing | Physics | 3 | Expired |
| US12282063B1 | Scan chain formation for improving chain resolution | Physics | 1 | Active |
| US7424656B2 | Clocking methodology for at-speed testing of scan circuits with synchronous clocks | Physics | 1 | Active |
| US8788993B2 | Computer system for generating an integrated and unified view of IP-cores for hierarchical analysis of a system on chip (SoC) design | Physics | 1 | Active |
| US6883134B2 | Method and program product for detecting bus conflict and floating bus conditions in circuit designs | Physics | 1 | Expired |
| US11829692B1 | Machine-learning-based design-for-test (DFT) recommendation system for improving automatic test pattern generation (ATPG) quality of results (QOR) | Physics | 1 | Active |
| US12333227B1 | Machine-learning-based design-for-test (DFT) recommendation system for improving automatic test pattern generation (ATPG) quality of results (QoR) | Physics | 0 | Active |
| US11842134B2 | Automated determinaton of failure mode distribution | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.