Patent · US Active

Spatially tunable deposition to compensate within wafer differential bow

US12338531B2 · kind B2 · utility

0Cited by
85References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 30, 2024
Grant dateJun 24, 2025
Priority date
Expiry dateJan 30, 2044

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/68785
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A plasma processing chamber for depositing a film on an underside surface of a wafer, includes a showerhead pedestal. The showerhead pedestal includes a first zone and a second zone. The first zone is configured for depositing a first film to the underside surface of the wafer and the second zone is configured for depositing a second film to the underside surface of the wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.