Management of hot add in a testing environment for DUTs that are CXL protocol enabled
US12353306B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 31, 2023 |
| Grant date | Jul 8, 2025 |
| Priority date | — |
| Expiry date | May 4, 2043 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2221/034
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Efficient and effective testing systems and methods are presented. In one embodiment, a system includes: a user interface configured to enable user interaction with the system; a test board configured to communicatively couple with a plurality of devices under test (DUTs), wherein the DUTs are compute express link (CXL) protocol compliant; and a tester configured to direct testing of the plurality of DUTs, wherein the tester is configured to enable hot add of one of the plurality of DUTs without interfering with testing of the other DUTS. In one exemplary implementation, the DUTs are memory devices and the DUTs can operate as extended memory. An added DUT can be automatically recognized by a host in a way that is transparent to users (e.g., BIOS can direct detection of characteristics of an added DUT, etc.). The tester automatically can direct the hot add in response to a user trigger.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.