Patent · US Active

Polishing pad and method for preparing semiconductor device using the same

US12362232B2 · kind B2 · utility

0Cited by
4References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 11, 2021
Grant dateJul 15, 2025
Priority date
Expiry dateAug 11, 2041

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/3212
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

The present invention provides a polishing pad, a process for preparing the same, and a process for preparing a semiconductor device using the same. In the polishing pad, the surface zeta potential and its ratio of the polishing surface are controlled to specific ranges according to the type of polishing slurry, whereby it is possible to improve the characteristics of scratches and surface defects appearing on the surface of the semiconductor substrate and to further enhance the polishing rate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.