Patent · US Active

Layout techniques and optimization for power transistors

US12363983B2 · kind B2 · utility

0Cited by
7References
20Claims
0Family size

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Inventors

Key dates

Filing dateFeb 20, 2024
Grant dateJul 15, 2025
Priority date
Expiry dateFeb 20, 2044

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/471
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An example field effect transistor includes a substrate, a first source metal over the substrate, a second source metal over the substrate, and a drain metal positioned between the first source metal and the second source metal over a channel of the field effect transistor. The drain metal includes a drain metal body having a notched region between the first source metal and the second source metal over the channel, and the notched region defines a first projecting portion and a second projecting portion of the drain metal body. In one aspect, the first projecting portion and the second projecting portion are positioned on respective sides of the notched region. The notched region is a triangular-shaped notched region in one example.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.