Peter Andrews
12Patents
8h-index
15Co-inventors
69Inventor score
Filing activity: Jun 11, 1992 → Jul 2, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5345170A | Wafer probe station having integrated guarding, Kelvin connection and shielding systems | Electricity | 122 | Expired |
| US7187188B2 | Chuck with integrated wafer support | Physics | 85 | Expired |
| US5434512A | Wafer probe station having integrated guarding, Kelvin connection and shielding systems | Physics | 60 | Expired |
| US7362115B2 | Chuck with integrated wafer support | Physics | 14 | Active |
| US7656172B2 | System for testing semiconductors | Physics | 11 | Active |
| US7535247B2 | Interface for testing semiconductors | Physics | 10 | Expired |
| US7940069B2 | System for testing semiconductors | Physics | 9 | Active |
| US7898281B2 | Interface for testing semiconductors | Physics | 8 | Active |
| US10365323B2 | Probe systems and methods for automatically maintaining alignment between a probe and a device under test during a temperature change | Physics | 1 | Active |
| US7688091B2 | Chuck with integrated wafer support | Physics | 1 | Active |
| US12379395B2 | Probes, probe blades, tools for probe blades, blade holders, and probe systems for electrically testing a device under test | Physics | 0 | Active |
| US9435858B2 | Focusing optical systems and methods for testing semiconductors | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.