Patent · US Active

Confocal chromatic metrology for EUV source condition monitoring

US12418972B2 · kind B2 · utility

0Cited by
3References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 14, 2022
Grant dateSep 16, 2025
Priority date
Expiry dateJan 12, 2044

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05H2240/20
  • WIPO fieldMedical technology
  • WIPO sectorInstruments

Abstract

A light source includes a rotatable drum to be coated with xenon ice and illuminated by a laser beam to produce a plasma. The drum may also be translatable. The light source further includes a confocal chromatic sensor to measure distances from the confocal chromatic sensor to the rotatable drum. The confocal chromatic sensor may include a sensor head to focus light onto the rotatable drum and to detect reflected light from the rotatable drum. The sensor head and the rotatable drum may be disposed within a vacuum chamber.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.