Patent · US Active

Integrated circuit structures having backside gate tie-down

US12419085B2 · kind B2 · utility

0Cited by
3References
20Claims
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Assignee

Inventors

Key dates

Filing dateMar 30, 2022
Grant dateSep 16, 2025
Priority date
Expiry dateJan 18, 2044

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/0151
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

Integrated circuit structures having backside gate tie-down are described. In an example, a structure includes a first vertical stack of horizontal nanowires over a first sub-fin, and a second vertical stack of horizontal nanowires over a second sub-fin, the second vertical stack of horizontal nanowires spaced apart from and parallel with the first vertical stack of horizontal nanowires. A gate structure includes a first gate structure portion over the first vertical stack of horizontal nanowires, wherein the first gate structure extends along an entirety of the first sub-fin. A second gate structure portion is over the second vertical stack of horizontal nanowires, wherein the second gate structure does not extend along an entirety of the second sub-fin. A gate cut is between the first gate structure portion and the second gate structure portion.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.