Patent · US Expired

Device fabrication by plasma etching

US4256534A · kind A · utility

50Cited by
3References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 31, 1978
Grant dateMar 17, 1981
Priority date
Expiry dateJul 31, 1998

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC23F4/00
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

Integrated circuit fabrication, e.g., silicon LSI is expedited by plasma etching in any of a novel class of etchants. Appropriate plasma environments are produced by introduction of halide-halogen combinations as exemplified by BCl.sub.3 -Cl.sub.2.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.