Patent · US Expired

Method for making integrated semiconductor circuit structure with formation of Ti or Ta silicide

US4332839A · kind A · utility

26Cited by
2References
3Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 22, 1981
Grant dateJun 1, 1982
Priority date
Expiry dateJan 22, 2001

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S148/147
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The compounds TiSi.sub.2 and TaSi.sub.2 have been found to be suitable substitutes for polysilicon layers in semiconductor integrated circuits. Suitable conducting properties of the compounds are ensured by providing a relatively thin substrate of polysilicon.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.