Apparatus for detecting two-dimensional pattern and method for transforming the pattern into binary image
US4506382A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 21, 1982 |
| Grant date | Mar 19, 1985 |
| Priority date | — |
| Expiry date | Apr 21, 2002 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/36
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Two-dimensional pattern detecting apparatus provided with register for serially receiving binary signals obtained from analog signals of a two-dimensional pattern and adapted to divide the pattern into pixels and to represent the density of bright and dark for pixels by the binary signals. The apparatus further includes a processing circuit adapted to compare with predetermined patterns a pattern composed of 8 peripheral pixels of a partial area of 3.times.3 pixels within the two-dimensional pattern, on the basis of the binary signals stored in the register. The processing circuit outputs a binary signal of a logic value stored in said register corresponding to a central pixel of the partial area when the pattern of the 8 pixels coincides with one of said predetermined patterns, and to outputs a binary signal of a logic value prevailing in 8 binary signals stored in the register corresponding to the 8 pixels when the pattern of the 8 pixels does not coincide with any of the predetermined patterns.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.