Patent · US Expired

Fast bipolar transistor for integrated circuit structure and method for forming same

US4682409A · kind A · utility

13Cited by
2References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 21, 1985
Grant dateJul 28, 1987
Priority date
Expiry dateJun 21, 2005

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S148/019
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An improved bipolar device is disclosed having a polysilicon emitter formed over a base region of a silicon substrate with oxide spacer portions formed on the sides of the emitter and metal silicide portions formed over the base region adjacent the oxide spacers whereby the use of polysilicon for the emitter results in high gain as well as vertical shrinking of the device because of the shallow diffusion of the emitter into the base and the elimination of an extrinsic base region. The use of oxide spacers and metal silicide adjacent the spacers results in a shrinkage of the horizontal spacing of the device to lower the base-emitter resistance and capacitance to thereby increase the speed of the device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.