Mammen Thomas
79Patents
18h-index
30Co-inventors
84Inventor score
Filing activity: Dec 22, 1983 → Dec 23, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5182632A | High density multichip package with interconnect structure and heatsink | Electricity | 125 | Expired |
| US5223741A | Package for an integrated circuit structure | Electricity | 58 | Expired |
| US5506431A | Double poly trenched channel accelerated tunneling electron (DPT-CATE) cell, for memory applications | Electricity | 51 | Expired |
| US5502315A | Electrically programmable interconnect structure having a PECVD amorphous silicon element | Electricity | 50 | Expired |
| US4639288A | Process for formation of trench in integrated circuit structure using isotropic and anisotropic etching | Electricity | 47 | Expired |
| US5691949A | Very high density wafer scale device architecture | Electricity | 45 | Expired |
| US4808548A | Method of making bipolar and MOS devices on same integrated circuit substrate | Emerging Cross-Sectional Technologies | 45 | Expired |
| US4616404A | Method of making improved lateral polysilicon diode by treating plasma etched sidewalls to remove defects | Emerging Cross-Sectional Technologies | 35 | Expired |
| US5252507A | Very high density wafer scale device architecture | Physics | 31 | Expired |
| US5780919A | Electrically programmable interconnect structure having a PECVD amorphous silicon element | Electricity | 29 | Expired |
| US4922318A | Bipolar and MOS devices fabricated on same integrated circuit substrate | Emerging Cross-Sectional Technologies | 28 | Expired |
| US5675161A | Channel accelerated tunneling electron cell, with a select region incorporated, for high density low power applications | Electricity | 26 | Expired |
| US4707456A | Method of making a planar structure containing MOS and bipolar transistors | Electricity | 25 | Expired |
| US4800171A | Method for making bipolar and CMOS integrated circuit structures | Emerging Cross-Sectional Technologies | 23 | Expired |
| US5315130A | Very high density wafer scale device architecture | Electricity | 20 | Expired |
| US4481070A | Double planarization process for multilayer metallization of integrated circuit structures | Electricity | 20 | Expired |
| US4929992A | MOS transistor construction with self aligned silicided contacts to gate, source, and drain regions | Emerging Cross-Sectional Technologies | 20 | Expired |
| US4468285A | Plasma etch process for single-crystal silicon with improved selectivity to silicon dioxide | Electricity | 19 | Expired |
| US4789760A | Via in a planarized dielectric and process for producing same | Electricity | 17 | Expired |
| US5514884A | Very high density wafer scale device architecture | Electricity | 16 | Expired |
| US4686763A | Method of making a planar polysilicon bipolar device | Electricity | 15 | Expired |
| US7206857B1 | Method and apparatus for a network processor having an architecture that supports burst writes and/or reads | Electricity | 14 | Expired |
| US4669180A | Method of forming emitter coupled logic bipolar memory cell using polysilicon Schottky diodes for coupling | Emerging Cross-Sectional Technologies | 14 | Expired |
| US4682409A | Fast bipolar transistor for integrated circuit structure and method for forming same | Emerging Cross-Sectional Technologies | 13 | Expired |
| US4456501A | Process for dislocation-free slot isolations in device fabrication | Electricity | 12 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.