Patent · US Expired

Position detecting system

US4702606A · kind A · utility

19Cited by
7References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 24, 1985
Grant dateOct 27, 1987
Priority date
Expiry dateMay 24, 2005

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/70358
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

An alignment system includes an element bearing a plurality of patterns on the surface thereof, the plurality of patterns being arranged in a predetermined direction, a stage for holding the element, scanning means for scanning the plurality of patterns of the element held by the stage in the predetermined direction and making position signals indicative of the positions of the plurality of patterns in the predetermined direction on the element, and operation means for operating and putting out a signal indicative of a position which is in a predetermined relation with the positions of the plurality of patterns in the predetermined direction, on the basis of the position signals.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.