Inventor · Chiba, JP

Seiro Murakami

15Patents
12h-index
19Co-inventors
71Inventor score

Filing activity: Dec 14, 1984 → Apr 29, 2003

Most-cited inventions

PatentTitleAreaCited byStatus
US5448332A Exposure method and apparatus Physics 419 Expired
US6608681B2 Exposure method and apparatus Physics 130 Expired
US5883704A Projection exposure apparatus wherein focusing of the apparatus is changed by controlling the temperature of a lens element of the projection optical system Physics 114 Expired
US5693439A Exposure method and apparatus Physics 98 Expired
US4860374A Apparatus for detecting position of reference pattern Physics 89 Expired
US6433872B1 Exposure method and apparatus Physics 83 Expired
US4677301A Alignment apparatus Physics 77 Expired
US5739899A Projection exposure apparatus correcting tilt of telecentricity Physics 54 Expired
US5464715A Method of driving mask stage and method of mask alignment Physics 37 Expired
US4655598A Position detection method and apparatus Physics 31 Expired
US4639604A Method and apparatus for detecting an edge position of a pattern and eliminating overlapping pattern signals Physics 20 Expired
US4702606A Position detecting system Physics 19 Expired
USRE38320E1 Projection exposure apparatus wherein focusing of the apparatus is changed by controlling the temperature of a lens element of the projection optical system General 9 Expired
USRE38113E1 Method of driving mask stage and method of mask alignment General 7 Expired
US6894763B2 Exposure apparatus and methods utilizing plural mask and object stages movable in opposite directions, and methods of producing devices using the same Physics 7 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.