Patent · US Expired

dRAM cell and method

US4713678A · kind A · utility

56Cited by
9References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 13, 1986
Grant dateDec 15, 1987
Priority date
Expiry dateNov 13, 2006

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B12/395

Abstract

A dRAM cell and array of cells, together with a method of fabrication, are disclosed wherein the cell includes one field effect transistor and one storage capacitor with the capacitor formed in a trench in a substrate and the transistor channel formed by epitaxial growth on the substrate. The transistor source and drain are insulated from the substrate, and the transistor may be adjacent the trench or on the upper portion of the trench sidewalls. Signal charge is stored on the capacitor plate insulated from the substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.