Semiconductor memory having error correcting means
US4726021A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 17, 1986 |
| Grant date | Feb 16, 1988 |
| Priority date | — |
| Expiry date | Apr 17, 2006 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/24
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A semiconductor memory having an error correcting function is provided, which has a device by which the user finds no difficulty in making use of the semiconductor memory and can test it with ease. In the semiconductor memory, a signal indicative of the completion of the preparation for reading/writing is outputted from the memory so that the user, after detecting the output of this signal, performs reading/writing data. To facilitate tests, such as a memory cell test for a redundant bit (check bit), an encoding circuit test and a decoding circuit test, the present invention provides that the arranged tests can be made independently of each other.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.