Optical temperature measurement techniques
US4789992A · kind A · utility
43Cited by
13References
38Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 19, 1987 |
| Grant date | Dec 6, 1988 |
| Priority date | — |
| Expiry date | Mar 19, 2007 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K11/3213
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical temperature measurement technique that utilizes the decaying luminescent intensity characteristic of a sensor composed of a luminescent material that is excited to luminescence by a light pulse or other periodic or other intermittent source of radiation. The luminescent emissions of a preferred sensor exhibit an approximately exponential decay with time that is the average of a distribution of chemically reproducible crystallites and are repeatable with a high degree of accuracy regardless of excitation level or prior temperature history of the sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.