Chusuke Munakata
13Patents
10h-index
23Co-inventors
68Inventor score
Filing activity: May 1, 1981 → Aug 27, 1990
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4731855A | Pattern defect inspection apparatus | Electricity | 52 | Expired |
| US4876458A | Apparatus for measuring particles in liquid | Physics | 44 | Expired |
| US4767211A | Apparatus for and method of measuring boundary surface | Physics | 44 | Expired |
| US4733063A | Scanning laser microscope with aperture alignment | Physics | 39 | Expired |
| US4563642A | Apparatus for nondestructively measuring characteristics of a semiconductor wafer with a junction | Physics | 23 | Expired |
| US5140272A | Method of semiconductor surface measurment and an apparatus for realizing the same | Physics | 23 | Expired |
| US4581578A | Apparatus for measuring carrier lifetimes of a semiconductor wafer | Emerging Cross-Sectional Technologies | 21 | Expired |
| US4827143A | Monitor for particles of various materials | Physics | 19 | Expired |
| US4464627A | Device for measuring semiconductor characteristics | Physics | 15 | Expired |
| US5252719A | Process for preparing protein-oriented membrane | Emerging Cross-Sectional Technologies | 10 | Expired |
| US4672578A | Method of information recording on a semiconductor wafer | Physics | 4 | Expired |
| US4453181A | Scanning-image forming apparatus using photo response signal | Electricity | 3 | Expired |
| US4791288A | Scanning photon microscope for simulataneously displaying both the ampitude and phase distributions of ac photovoltage or photocurrents | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.