Patent · US Expired

Method of making bipolar and MOS devices on same integrated circuit substrate

US4808548A · kind A · utility

45Cited by
5References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 23, 1987
Grant dateFeb 28, 1989
Priority date
Expiry dateNov 23, 2007

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S148/124
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An improved integrated circuit structure is disclosed comprising bipolar and MOS devices formed on the same substrate. The bipolar devices have at least the emitter and the collector contact portions formed from a polysilicon layer which results in raised contacts. The MOS devices are similarly formed with raised gate contact portions formed from the same polysilicon layer. Metal silicide is formed over at least a portion of the base, source, and drain regions to provide conductive paths to the base, source, and drain contacts. In one embodiment, the base, source, and drain contacts are also formed from the same polysilicon layer to permit formation of a highly planarized structure with self-aligned contacts formed by planarizing an insulating layer formed over the structure sifficiently to expose the upper surface of the contacts.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.