Patent · US Expired

Gas treatment apparatus and method

US4838983A · kind A · utility

80Cited by
8References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 18, 1988
Grant dateJun 13, 1989
Priority date
Expiry dateMar 18, 2008

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC30B25/14
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

Substrates such as semiconductor wafers are treated with a gas by advancing the substrate along a path, preferably a circular path through the gas while maintaining a face of the substrate transverse, preferably oblique, to the path so taht the gas contacts be exposed from the face of the substrate. Preferably, a plurality of substrates are treated simultaneously, and the substrates serve as vanes to impel the gas into rotational motion, thereby pumping the gas through the process chamber. Preferably, the substrates are carried on susceptors having generally planar faces, the susceptors also serving as vanes impelling the gas into rotational motion. The gas may be a depositing gas for forming epitaxial layers on the faces of the substrates, or an etching gas.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.